Chip Scale Package (CSP) - Page 2 of 2     

                           

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A typical chip scale packaging process starts with the mounting of the die on the interposer using epoxy, usually of non-conductive type (although conductive epoxy is also used when the die backside needs to be connected to the circuit).  The die is then wirebonded to the interposer using gold or aluminum wires.  Wirebond profiles must be as low and as close to the die as possible in order to minimize package size. 

     

Plastic encapsulation to protect the die and wires then follows, usually by transfer molding.  After encapsulation, solder balls are attached to the bottom side of the interposer, after which the package is marked. Finally, the parts are singulated from the leadframe.

  

 Figure 3. Cross-section of a Wirebonded CSP

  

   

 Figure 4. Cross-section of a Flip-chip CSP

   

The chip scale package is relatively new, so industry standards for producing CSP's have not yet been completely developed. Nonetheless, the Institute for Interconnecting and Packaging Electronic Circuits (IPC) has already released J-STD-012, "Implementation of Flip Chip and Chip Scale Technology."  This document discusses technology overview and design considerations, as well as material, processing, mounting, interconnection, reliability, and standardization aspects of CSP manufacturing.  

  

The industry is moving towards the development of more chip scale packaging standards.  Some of the new standards being developed as of this writing are, in fact, defined by J-STD-012.  These standards are shown in Table 1.

 

Table 1. Flip Chip and CSP Standards Currently Undergoing Development

Std No. 102

Mechanical outline Standard for Flip Chip or Chip Scale Configurations

Std No. 103

Performance Standard for Flip Chip/Chip Scale Bumps

Std No. 104

Test Methods for Flip Chip or Chip Scale Performance

Std No. 105

Flip Chip/Chip Scale Carrier Tray Standard

Std No. 106

Bare Dice as Flip Chip or Chip Scale Configuration Management Standard

Std No. 107

Design Standard for Flip Chip and Chip Scale Mounting Structures

Std No. 111

Design Standard for Flip Chip/Chip Scale Assembly Configuration

Std No. 112

Standard for Flip Chip/Chip Scale Assembly Performance Requirements

Std No. 113

Test Methods for Qualification and Evaluation of Flip Chip/Chip Scale Assemblies

Std No. 114

Standard for Flip Chip/Chip Scale Assembly Rework and Repair Techniques

Std No. 115

Flip Chip/Chip Scale Assembly Reliability Standard

Std No. 120

Qualification and Performance Standard for Flux used in Flip Chip Assembly

           

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See Also:  Wafer Backgrind Die Preparation Die Attach Wirebonding Molding;

Wafer-level PackagingFlip Chip AssemblyBGA IC Manufacturing Assembly Equipment

   

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