EDX Analysis
and WDX Analysis
EDX Analysis
EDX Analysis stands for Energy Dispersive
X-ray analysis. It is sometimes referred to also as EDS or EDAX analysis. It is a technique used for identifying the elemental composition of the specimen, or an area of interest thereof.
The EDX analysis system works as an integrated feature of a
scanning
electron microscope (SEM), and can not operate on its own without the
latter.
During EDX Analysis, the specimen is bombarded with an
electron
beam inside the scanning electron microscope. The bombarding electrons collide with the specimen atoms' own
electrons, knocking some of them off in the process. A position vacated by
an ejected inner shell electron is eventually occupied by a higher-energy
electron from an outer shell. To be able to do so, however, the
transferring outer electron must
give up
some of its energy by emitting an
X-ray.
The amount of energy released by the
transferring electron depends on which shell it is transferring
from, as well as which shell it is transferring
to. Furthermore, the atom of every element releases
X-rays
with
unique
amounts of
energy during the transferring process. Thus, by measuring the amounts of
energy present in the
X-rays being released by a specimen during electron beam bombardment, the identity of the atom from which the
X-ray was emitted can be
established.
The output of an EDX analysis is an
EDX spectrum
(see
Figure 2 on Page 2). The EDX spectrum is just a plot of how frequently an
X-ray is received for each energy level. An EDX spectrum normally displays peaks corresponding to the
energy levels for which the most X-rays had been received. Each of these peaks are unique to an atom, and therefore corresponds to a single element. The higher a peak in a spectrum, the more concentrated the element is in the
specimen.
An EDX spectrum plot not only identifies the element corresponding to each of its peaks, but the
type of X-ray to which it corresponds as well. For example, a peak corresponding to the amount of energy possessed by
X-rays emitted by an electron in the L-shell going down to the K-shell is identified as a K-Alpha peak. The peak corresponding to X-rays emitted by M-shell electrons going to the K-shell is identified as a K-Beta
peak. See Figure 1.

Figure
1. Elements in an EDX spectrum are identified
based on the
energy content of the X-rays emitted by their electrons as
these electrons
transfer from a higher-energy shell to a lower-energy one
<Proceed
to Page 2 - EDX Analysis Guidelines; WDX Analysis Basics>
<Go to WDX Analysis>
See Also:
SEM/TEM;
Auger Analysis;
FTIR Spectroscopy;
SIMS;
LIMS;
ESCA or XPS;
Chromatography;
Failure
Analysis; FA Techniques; Basic FA
Flows;
Package Failures; Die
Failures
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