|
Fab Area |
Chemical
Reaction |
Reaction Equation(s) |
Remarks |
|
Epitaxy |
Hydrogen reaction
of SiCl4 to deposit a silicon epitaxial layer |
SiCl4 +
2 H2 → Si + 4 HCl |
reversible process
- Si may also be etched using HCl |
|
Epitaxy |
Silane (SiH4)
reaction to deposit a silicon epitaxial layer |
SiH4 →
Si + 2H2 |
can be done at a
relatively lower temperature |
|
SiO2
Thermal Oxidation |
Silicon dioxide
(SiO2) deposition through dry thermal oxidation |
Si + O2
→ SiO2 |
deposition
temperature usually bet. 700-1300 deg C |
|
SiO2
Thermal Oxidation |
Silicon dioxide
(SiO2) deposition through wet thermal oxidation |
Si + H2O
→ SiO2 + 2H2 |
deposition
temperature usually bet. 700-1300 deg C |
|
SiO2
CVD |
SiO2
deposition through CVD reaction between silane (SiH4) and O2 |
SiH4 +
O2 → SiO2 + 2H2 |
low-temperature
deposition process |
|
SiO2
CVD |
SiO2
deposition through PECVD reaction between silane (SiH4)
and N2O |
SiH4 +
2N2O → SiO2 + 2N2 + 2H2 |
deposition
temperature usually bet. 200-400 deg C |
|
SiO2
CVD |
SiO2
deposition through LPCVD reaction between dichlorosilane (SiH2Cl2)
and N2O |
SiH2Cl2
+ 2 N2O → SiO2 + 2N2 + 2HCl |
high deposition
temperature of almost 900 deg C |
|
Si3N4
CVD |
Silicon nitride
(Si3N4) deposition through LPCVD reaction between dichlorosilane (SiCl2H2) and ammonia (NH3) |
3 SiCl2H2
+ 4 NH3 → Si3N4 + 6H2 + 6 HCl |
deposition
temperature usually bet. 700-800 deg C |
|
Si3N4
CVD |
Si3N4
deposition through PECVD reaction between silane (SiH4) and NH3 |
SiH4 +
NH3 → SixNyHz+ H2 |
deposition
temperature usually bet. 200-350 deg C |
|
Poly-Si CVD |
Polysilicon
deposition through LPCVD reactions of SiH4 |
SiH4 +
surface site → SiH4 (adsorbed);
SiH4
(adsorbed) → SiH2
+ H2;
SiH2
→ Si
+H2
|
deposition
temperature usually bet. 580-650 deg C;
over-all reaction:
SiH4
→ Si
+2H2 |
|
W CVD |
Tungsten (W)
deposition through CVD reaction between WF6 and Si |
WF6 + 3
Si → 2W +
3 SiF4 |
deposition done
between 200-400 deg C |
|
W CVD |
Tungsten (W)
deposition through CVD reaction between WF6 and H |
WF6 + 3
H2 → W +
6HF |
deposition done
between 250-500 deg C |
|
WSi2
CVD |
Tungsten silicide
(WSi2) deposition through CVD reaction between WF6 and
SiH4 |
WF6 + 2
SiH4 + → WSi2 + 6HF + H2 |
deposition must be
done at an elevated temperature |
|
TiSi2
CVD |
Titanium silicide
(TiSi2) deposition through CVD reaction between TiCl4
and SiH4 |
TiCl4 +
2 SiH4 + → TiSi2 + 4HCl + 2H2 |
deposition must be
done at an elevated temperature |
|
Si Wet Etching |
Removal of Si
through wet etching with HNO3 and HF |
Si + HNO3
+ 6 HF → H2SiF6 + HNO2 + H2 + H2O |
acetic acid is
preferred as a buffering agent |
|
SiO2
Wet Etching |
Removal of SiO2
through wet etching with HF |
SiO2+
6 HF → SiF6 + H2 + 2H2O |
use at room temp
to prevent HF attack of Si |