|
Mil-Std-883
Method 5005 Quality Conformance Inspection
(QCI) Group Tests - Page 1 of
3:
Group A and
Group C Tests
The following
group tests are used for qualifications or quality conformance
inspections of semiconductor products used for military purposes.
Table 1.
Mil-Std-883 Method 5005 Group A Electrical Tests
(for
Class-S and Class-B Devices)
|
Subgroup |
Examination/Test |
SS |
Accept # |
Conditions |
|
Subgroup
1 |
Static Tests |
116 |
0 reject |
Tamb = 25 deg
C |
|
Subgroup
2 |
Static Tests |
116 |
0 reject |
Tamb = Tmax |
|
Subgroup
3 |
Static Tests |
116 |
0 reject |
Tamb = Tmin |
|
Subgroup
4 |
Dynamic Tests |
116 |
0 reject |
Tamb = 25 deg
C |
|
Subgroup
5 |
Dynamic Tests |
116 |
0 reject |
Tamb = Tmax |
|
Subgroup
6 |
Dynamic Tests |
116 |
0 reject |
Tamb = Tmin |
|
Subgroup
7 |
Functional Tests |
116 |
0 reject |
Tamb = 25 deg
C |
|
Subgroup
8 |
Functional Tests |
116 |
0 reject |
Tamb = Tmax |
|
Subgroup
8b |
Functional Tests |
116 |
0 reject |
Tamb = Tmin |
|
Subgroup
9 |
Switching Tests |
116 |
0 reject |
Tamb = 25 deg
C |
|
Subgroup
10 |
Switching Tests |
116 |
0 reject |
Tamb = Tmax |
|
Subgroup
11 |
Switching Tests |
116 |
0 reject |
Tamb = Tmin |
Table 2.
Mil-Std-883 Method 5005 Group C (Die-Related) Tests
(for
Class-B Devices Only)
|
Subgroup |
Tests /Conditions |
SS |
Accept # |
|
Subgroup
1
|
a.
Steady-state Life Test -
Mil-Std-883 Method 1005
-
use bias conditions per
device specifications;
- 1000 hours at 125 deg C
or equivalent per Table I of Method 1005
|
45 |
0 reject |
|
b.
End-point electrical parameters
-
Per the applicable
device specifications |
45 |
0 reject |
Disclaimer:
The original
document from which the information on this web page were taken,
Mil-Std-883 Method 5005, contains
many notes that do not appear on this page. Thus, people are
advised to use this web page in conjunction with the original document.
<Proceed to Table 3 - Group B Tests>
<Proceed to Table 4 - Group D Tests>
See Also:
Mil-Std-883 Methods;
Mil-PRF-38535;
Mil
Lot Screen Tests (Method 5004);
Reliability
Engineering; Reliability Tests
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