Mil-Std-883 Method 5004 Tests for Military Lot Screening

Table 1 enumerates the required tests for screening Class-S and Class-B military lots.

Table 1. Mil-Std-883 Method 5004 Tests for Screening Class-S

and Class-B Military Products

Screen	Class-S		Class-B
Screen	Mil Method	Reqt.	Mil Method	Reqt.
3.1.1. Wafer Lot Acceptance	5007	All lots	N/A	---
3.1.2 Non-destructive Bond Pull	2023	100%	N/A	---
3.1.3 Internal Visual Inspection	2010, Test Condition A	100%	2010, Test Condition B	100%
3.1.4 Temperature Cycling	1010, Test Condition C	100%	1010, Test Condition C	100%
3.1.5 Constant Acceleration	2001, Test Condition E	100%	2001, Test Condition E	100%
3.1.6 Visual Inspection	for catastrophic failures	100%	for catastrophic failures	100%
3.1.7 Particle Impact Noise Detection (PIND)	2020, Test Condition A	100%	N/A	---
3.1.8 Serialization	---	100%	N/A	---
3.1.9 Pre-Burn-in Electrical Parameters	per device specifications	100%	per device specifications	100%
3.1.10 Burn-in	1015, 240H at 125C min.	100%	1015, 160H at 125C min.	100%
3.1.11 Interim Post-Burn-in Electrical Parameters	per device specifications	100%	N/A	---
3.1.12 Reverse-bias Burn-in	1015, Test Cond. A or C; 72H/150C	100%	N/A	---
3.1.13 Interim Post-Burn-in Electrical Parameters	per device specifications	100%	per device specifications	100%
3.1.14 Percent Defective Allowable (PDA) Computation	5% over-all; 3% for functional pa-rameters at 25C	All lots	5%	All lots
3.1.15 Final Electrical Tests a. Static Tests b. Dynamic/Functional Tests c. Switching Tests	per device specifications	100%	per device specifications	100%
3.1.16 Seal Tests a. Fine Leak b. Gross Leak	1014	100%	1014	100%
3.1.17 Radiographic Test	2012, two views	100%	N/A	---
3.1.18 Qualification or QCI Test Sampling	5005	per Mil Method 5005	5005	per Mil Method 5005
3.1.19 External Visual Inspection	2009	100% or 116(0) (see notes in Mil Method 5004)	2009	100% or 116(0) (see notes in Mil Method 5004)
3.1.20 Radiation Latch-up	1020	100%	1020	100%

Disclaimer: The original document from which the information on this web page were taken, Mil-Std-883 Method 5004 (Table I), contains many notes that do not appear on this page. Thus, people are advised to refer to the original document for complete details.

HOME