Mil-Std-883 Method 5004 Tests for Military Lot Screening

 

Table 1 enumerates the required tests for screening Class-S and Class-B military lots.       

            

Table 1.  Mil-Std-883 Method 5004 Tests for Screening Class-S

and Class-B Military Products

Screen

Class-S

Class-B

Mil Method

Reqt.

Mil Method

Reqt.

3.1.1. Wafer Lot Acceptance

5007

All lots

N/A

---

3.1.2 Non-destructive Bond Pull

2023

100%

N/A

---

3.1.3 Internal Visual Inspection

2010, Test Condition A

100%

2010, Test Condition B

100%

3.1.4 Temperature Cycling

1010, Test Condition C

100%

1010, Test Condition C

100%

3.1.5 Constant Acceleration

2001, Test Condition E

100%

2001, Test Condition E

100%

3.1.6 Visual Inspection

for catastrophic failures

100%

for catastrophic failures

100%

3.1.7 Particle Impact Noise Detection (PIND)

2020, Test Condition A

100%

N/A

---

3.1.8 Serialization

---

100%

N/A

---

3.1.9 Pre-Burn-in Electrical Parameters

per device specifications

100%

per device specifications

100%

3.1.10 Burn-in

1015, 240H at 125C min.

100%

1015, 160H at 125C min.

100%

3.1.11 Interim Post-Burn-in Electrical Parameters

per device specifications

100%

N/A

---

3.1.12 Reverse-bias Burn-in

1015, Test Cond. A or C; 72H/150C

100%

N/A

---

3.1.13 Interim Post-Burn-in Electrical Parameters

per device specifications

100%

per device specifications

100%

3.1.14 Percent Defective Allowable (PDA) Computation

5% over-all; 3% for functional pa-rameters at 25C

All lots

5%

All lots

3.1.15 Final Electrical Tests

a.  Static Tests

b.  Dynamic/Functional Tests

c.  Switching Tests

per device specifications

100%

per device specifications

100%

3.1.16 Seal Tests

a. Fine Leak

b. Gross Leak

1014

100%

1014

100%

3.1.17 Radiographic Test

2012, two views

100%

N/A

---

3.1.18 Qualification or QCI Test Sampling

5005

per Mil Method 5005

5005

per Mil Method 5005

3.1.19 External Visual Inspection

2009

100% or 116(0) (see  notes in Mil Method 5004)

2009

100% or 116(0)

(see  notes in Mil Method 5004)

3.1.20 Radiation Latch-up

1020

100%

1020

100%

                       

Disclaimer: The original document from which the information on this web page were taken, Mil-Std-883 Method 5004 (Table I), contains many notes that do not appear on this page.  Thus, people are advised to refer to the original document for complete details. 

       

See Also:  Mil-Std-883 Methods;  Mil QCI Group Tests (Method 5005)

   

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