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Semiconductor Test Equipment - Page 2 of 3
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Test Handlers
Mass
production electrical testing can only be possible by attaching a test
handler to an ATE. A
test handler
(see Fig. 2) refers to the equipment
used in
presenting
the unit to be tested to the
test site
of the ATE, allowing the ATE to test the unit. After testing, the handler
puts the unit to the appropriate output location based on the ATE test
results.
Test
handlers vary widely in configuration.
Some use gravity
to bring the device under test (DUT) to the test
site and to reload them back into tubes.
Others use special
electromechanical
or pick-and-place systems to
accomplish this. Some handlers can only be assigned to one tester, yet
some can be allocated to eight or
more
testers. A typical test handler is
equipped with a loading or input stage, a test site, a sort shuttle, an
unloading or output stage, various sensors, and interfaces to the tester.
For
gravity-fed handlers, the input stage usually consists of input tracks
into which the input tubes containing the units to be tested are inserted. The units slide down the input track into the test site for
testing. After testing, the
unit is then transported by the sort shuttle to the appropriate output
track based on whether the unit is good or bad.
Pick-and-place handlers usually pick the units for testing from a
tray and present them to the test site for testing.
After testing, the pick-and-place system takes the unit and puts it
into the appropriate output tray.
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